48 research outputs found

    III-V and 2D Devices: from MOSFETs to Steep-Slope Transistors

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    With silicon CMOS technology approaching the scaling limit, alternating channel materials and novel device structures have been extensively studied and attracted a lot of attention in solid-state device research. In this dissertation, solid-state electron devices for post-Si CMOS applications are explored including both new materials such as III-V and 2D materials and new device structures such as tunneling field-effect transistors and negative capacitance field-effect transistors. Multiple critical challenges in applying such new materials and new device structures are addressed and the key achievements in this dissertation are summarized as follows: 1) Development of fabrication process technology for ultra-scaled planar and 3D InGaAs MOSFETs. 2) Interface passivation by forming gas anneal on InGaAs gate-all-around MOSFETs. 3) Characterization methods for ultra-scaled MOSFETs, including a correction to subthreshold method and low frequency noise characterization in short channel devices. 4) Development of short channel InGaAs planar and 3D gate-allaround tunneling field-effect transistors. 5) Negative capacitance field-effect transistors with hysteresis-free and bi-directional sub-thermionic subthreshold slope and the integration with various channel materials such as InGaAs and MoS2

    β\beta-Ga2_2O3_3 Nano-membrane Negative Capacitance Field-effect Transistor with Steep Subthreshold Slope for Wide Bandgap Logic Applications

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    Steep-slope β\beta-Ga2_2O3_3 nano-membrane negative capacitance field-effect transistors (NC-FETs) are demonstrated with ferroelectric hafnium zirconium oxide in gate dielectric stack. Subthreshold slope less than 60 mV/dec at room temperature is obtained for both forward and reverse gate voltage sweeps with a minimum value of 34.3 mV/dec at reverse gate voltage sweep and 53.1 mV/dec at forward gate voltage sweep at VDSV_{DS}=0.5 V. Enhancement-mode operation with threshold voltage ~0.4 V is achieved by tuning the thickness of β\beta-Ga2_2O3_3 membrane. Low hysteresis of less than 0.1 V is obtained. The steep-slope, low hysteresis and enhancement-mode β\beta-Ga2_2O3_3 NC-FETs are promising as nFET candidate for future wide bandgap CMOS logic applications.Comment: 21 pages, 5 figure
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